Le, H. A., Tran, L. D. A., Hoang, S. H., & Nguyen, T. H. (2024). Advanced Machine Learning and Deep Learning Techniques for Anomaly Detection in Industrial Control System. JST: Smart Systems and Devices, 34(3), 9-16. https://doi.org/10.51316/jst.176.ssad.2024.34.3.2