LE, Hai Anh; TRAN, Le Duc Anh; HOANG, Si Hong; NGUYEN, Thi Hue. Advanced Machine Learning and Deep Learning Techniques for Anomaly Detection in Industrial Control System. JST: Smart Systems and Devices, [S. l.], v. 34, n. 3, p. 9–16, 2024. DOI: 10.51316/jst.176.ssad.2024.34.3.2. Disponível em: https://jst.vn/index.php/ssad/article/view/64. Acesso em: 19 jun. 2025.