Le, Hai Anh, Le Duc Anh Tran, Si Hong Hoang, and Thi Hue Nguyen. “Advanced Machine Learning and Deep Learning Techniques for Anomaly Detection in Industrial Control System”. JST: Smart Systems and Devices 34, no. 3 (September 15, 2024): 9–16. Accessed June 18, 2025. https://jst.vn/index.php/ssad/article/view/64.